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Deep learning for non-transvenous ICD screening: tailored neural network architectures, extended experiments, and explainability
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First announced by arXiv: 2026-10-30 · Indexed by Pub-AI: 2026-10-30 UTC
Deep learning for non-transvenous ICD screening: tailored neural network architectures, extended experiments, and explainability
First announced by arXiv: 2026-10-30 · Original record ↗
- arxiv
- 2610.37993
Explicit source versions (1)
- v1 · Date not supplied
- Preprint available
Source date: 2026-10-30 · First detected: 2026-10-30 UTC · Historical baseline
Source evidence (1)
- Official evidence ↗ · RSS guid=oai:arXiv.org:2610.37993v1; arxiv:announce_type=new; item pubDate (official metadata)
Abstract · arxiv
This paper studies two non-transvenous implantable cardioverter-defibrillators (ICDs), namely the Subcutaneous ICD (S-ICD) and the Extravascular ICD (EV-ICD). Both avoid the complications of transvenous leads but are prone to oversensing, which can trigger inappropriate shocks associated with increased mortality. Oversensing risk is predicted by the ratio of T- or P-wave amplitude to R-wave amplitude (T:R, P:R), and these ratios vary over a 24-hour period. Yet S-ICD screening uses a single 10-second electrocardiogram (ECG) segment, and the EV-ICD has no formal screening protocol whatsoever. We present a 24-hour ambulatory screening framework for both devices which includes the first T:R analysis in an EV-ICD cohort and the first full evaluation of P:R prediction. We introduce AmpRatioNet, a family of 1D convolutional neural network architectures operating directly on the ECG signal, and benchmark it against the best existing approach - based on 2D phase space reconstruction images. Evaluation uses 4,605 clinician-annotated 10-second segments from 89 patients, with patient-level 10-fold cross-validation and bootstrap confidence intervals. AmpRatioNet-SE demonstrates superior performance on every metric in each setting with no device- or ratio-specific redesign. An explainability analysis against interpretable classical peak labelling algorithms shows that AmpRatioNet-SE's increase in error on oversensing-prone segments is up to 14 times smaller than theirs. Segment-level predictions are aggregated into a 24-hour timeline, extending S-ICD screening beyond 10 seconds and offering a plausible EV-ICD screening pathway pending device-level validation.